Abstract: The noisy shuffling channel models the conditions encountered in DNA storage systems, where transmitted data segments experience random permutation and substitution errors. Reliable ...
Abstract: This study aims to explore the solder fatigue lifetime of a developed high-voltage (1.7 kV/100 A) SiC power MOSFET module for on-board chargers (OBCs) subjected to power cycling test (PCT) ...
CES 2026 is just around the corner and we will be there again. Here, we look back at our 2025 coverage, which was very ...
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