Teradyne Inc., Boston, has introduced a memory test system with an architecture designed to test and repair DRAM wafers. Teradyne (nyse: TER) said that it is the first automated test equipment system ...

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

Background and objectives: The nonisotopic DNA probe assay (PACE 2) was evaluated for the detection of Neisseria gonorrhoeae in urethral and endocervical specimens and compared quantitatively and ...

The importance of properly integrating test points into a PCB design. Test-point deployment considerations. When it comes to creating a modern electronic design, we live in both the best and the worst ...

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

[Piffpaffpoltrie] had a problem. They found the InLine VA40R to be a perfectly usable multimeter, except for a couple of flaws. Most glaring among these were the tiny sockets for the test probes.

The PTT pocket temperature test probes measure surface or immersion temperatures in degrees Celsius or Fahrenheit. The TPP1 immersion probes and TPP2 surface-area probes measure from −50°C to 250°C ...

Livermore, Calif.—FormFactor Inc. has developed a family of advanced wafer probe cards designed to address the rising cost and technology challenges associated with testing wire bond logic and ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Exploring “space weather” – or changes in the Earth’s space environment caused by the sun – means plunging into extremes of temperature, radiation and magnetic interference. When NASA’s twin Radiation ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...