PI Introduces Miniaturized Alignment Engine Platform for Scalable, Parallel E/O Wafer-Level Test Parallel piezo aligners with fly height sensors enable faster PIC wafer testing.

Aehr Test Systems (NASDAQ:AEHR) used a recent presentation to outline its position in semiconductor reliability testing, with ...

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order from a ...

FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

FREMONT, CA / ACCESSWIRE / January 7, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial production order ...

FREMONT, Calif., Oct. 06, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has released ...

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

FREMONT, Calif., Aug. 09, 2017 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received follow-on orders ...

Cascade Microtech Inc. today will field a characterization system that it says can shave weeks off the power semiconductor development cycle. The Tesla probe station allows power semiconductors to be ...