To ensure that the speed of composites fabrication keeps pace with customer demand, the ability to inspect and monitor composite part quality must become an integral part of high-rate part ...

Wafers can be inspected for large, obvious defects, or for small, subtle ones. The former is referred to as macro-inspection, while the latter is micro-inspection. These processes use different ...

Experts at the Table: Semiconductor Engineering sat down to talk about how to inspect and measure smaller features across large areas in advanced packaging, with Frank Chen, director of applications ...