Johnstech International has announced the release of its new Low-Force XL contacts for Pad ROL100A Series and Pad ROL200 Series test contactors for testing NiPdAu IC packages. The new contactors offer ...
As semiconductor packages grow more complex, conventional continuity tests are no longer adequate for screening out open circuits and pin-to-pin shorts. Most test methods were designed for devices ...
Dec. 16, 2010, 9:16 PM UTC / Source: GlobeNewswire FREMONT, Calif., Dec. 16, 2010 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, ...
POWAY, Calif.--(BUSINESS WIRE)--Cohu, Inc. (NASDAQ:COHU) a leading supplier of semiconductor equipment announced today the introduction of RF Scrub contactor for testing a wide spectrum of devices ...
POWAY, Calif.--(BUSINESS WIRE)--Cohu Inc. (NASDAQ:COHU), a leading supplier of semiconductor test handlers and contactors, announced today the introduction of the new cHybrid solution for testing ...
Designing a load board or circuit board for IC testing sounds like a routine task that involves a few basic requirements and some common-sense approaches. But it’s not always that simple. With new ...
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