ROTTERDAM, The Netherlands, July 09, 2024 (GLOBE NEWSWIRE) -- Nearfield Instruments B.V., a provider of groundbreaking process control metrology solutions for advanced semiconductor devices, today ...
ROTTERDAM, The Netherlands, Nov. 18, 2025 (GLOBE NEWSWIRE) -- Nearfield Instruments, the leader in 3D, non-destructive, in-line process control solutions based on scanning probe technology, today ...
Lightning Mode™ boosts image acquisition speed 160-fold over current automated AFM metrologyROTTERDAM, The Netherlands, July 09, 2024 (GLOBE NEWSWIRE) -- Nearfield Instruments B.V., a provider of ...
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