Safety mechanisms designed to handle rare events can become unreliable under sustained or intense fault conditions.

Test point selection and fault diagnosis remain critical challenges in the analysis and maintenance of analog systems. As these systems operate with continuous-valued signals and are susceptible to ...

Geotest-Marvin Test Systems has announced the addition of a fault-library plug-in module and a fault editor to its $3995 ATEasy 5.0, vendor-independent, open-architecture test executive and rapid-test ...

The Smart-Thump from HDW Electronics is a fully integrated underground cable fault locating system that requires less training than a traditional thumper because it interprets the results of the ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...