The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; I DDQ test methodologies; ...
Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...
To understand the importance of the discovery of the fast Fourier transform (FFT) on the modern computing age, it's first necessary to understand the purpose of the discrete Fourier Transform (DFT).
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