The Axio CSM 700 confocal microscope from Carl Zeiss meets user demands for rapid and robust noncontact measurement of 3-D microstructures and determination of surface roughness. Ideal for materials ...
Thornwood, N.Y. – Carl Zeiss MicroImaging Inc., a leading provider of microscopy solutions for a variety of research, clinical and industrial applications, introduces the SteREO Discovery.V20 ...
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The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...
ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450. The instrument combines ultrahigh resolution imaging with the capability to perform advanced ...
An interview with Scott Olenych, from ZEISS, to discuss the challenges faced in neuroscience research microscopy techniques and to discuss their latest microscope that could help overcome some of ...
Carl Zeiss SMT, a provider of electron- and ion-beam imaging and analysis equipment for nanotechnology applications, said at Semicon West that it has shipped its first Orion helium ion microscope to ...
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Carl Zeiss provides very robust and easy to use devices with NIR technology for the quality control of the incoming grain, barley, corn, wheat, flour and so on in silo installations or mills. Diode ...
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